US Patent 7319625 Built-in memory current test circuit
Patent 7319625 was granted and assigned to Industrial Technology Research Institute on January, 2008 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
July 7, 2006
Date of Patent
January 15, 2008
Patent Application Number
11481966
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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