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US Patent 7319625 Built-in memory current test circuit

Patent 7319625 was granted and assigned to Industrial Technology Research Institute on January, 2008 by the United States Patent and Trademark Office.

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Patent attributes

Current Assignee
Industrial Technology Research Institute
Industrial Technology Research Institute
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
7319625
Date of Patent
January 15, 2008
Patent Application Number
11481966
Date Filed
July 7, 2006
Patent Primary Examiner
‌
Michael T. Tran
Patent abstract

A built-in memory current test circuit to test a memory on a chip is disclosed, comprising a built-in self-test circuit and a dynamic current generation module. The built-in self-test circuit is disposed on the chip to receive and process a test signal and generate a control signal to control operation of the memory and a current control code. The dynamic current generation module, also disposed on the chip, produces a test current into the memory based on the current control code. The current switch time is reduced in the built-in memory current test circuit, and an integrated test combining functional and stress tests can thus be performed.

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