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US Patent 7237158 Intelligent binning for electrically repairable semiconductor chips

Patent 7237158 was granted and assigned to Micron Technology on June, 2007 by the United States Patent and Trademark Office.

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Patent Inventor Names
Brett M. Debenham0
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Patent abstract

The present invention relates to a system and method for testing one or more semiconductor devices (e.g., packaged chips). Test equipment performs at least tests of a first type on the semiconductor device and identifies failures in the semiconductor device, if any. A number of failures are determined. In the case where there are some failures, decision circuitry determines whether it is more efficient to repeat the tests or repair the semiconductor device, if it is repairable.

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US Patent 07237158 Intelligent binning for electrically repairable semiconductor chips US Patent 7237158 Intelligent binning for electrically repairable semiconductor chips

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Patent Number
072371580
Patent Number
72371580
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Official Website
https://pdfpiw.uspto.gov/.piw?Docid=072371580
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Infobox
Is a
Patent
Patent
0
Current Assignee
Micron Technology
Micron Technology
0
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
0
Patent Number
072371580
Date of Patent
June 26, 2007
0
Patent Application Number
106087980
Date Filed
June 26, 2003
0
Official Website
https://pdfpiw.uspto.gov/.piw?Docid=072371580
Patent Primary Examiner
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Phung My Chung
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Website URL
https://pdfpiw.uspto.gov/.piw?Docid=07237158
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 US Patent 07237158 Intelligent binning for electrically repairable semiconductor chips

Infobox
Is a
Patent
Patent
Current assignee
Micron Technology
Micron Technology
Patent jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent number
07237158
Date of patent
June 26, 2007
Patent application number
10608798
Date Filed
June 26, 2003
Patent primary examiner
‌
Phung My Chung

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