US Patent 7237158 Intelligent binning for electrically repairable semiconductor chips

Patent 7237158 was granted and assigned to Micron Technology on June, 2007 by the United States Patent and Trademark Office.

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Patent

Patent attributes

Current Assignee

Micron Technology

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

72371580

Patent Inventor Names

Brett M. Debenham0

Date of Patent

June 26, 2007

Patent Application Number

106087980

Date Filed

June 26, 2003

Patent Primary Examiner

‌

Phung My Chung

Patent abstract

The present invention relates to a system and method for testing one or more semiconductor devices (e.g., packaged chips). Test equipment performs at least tests of a first type on the semiconductor device and identifies failures in the semiconductor device, if any. A number of failures are determined. In the case where there are some failures, decision circuitry determines whether it is more efficient to repeat the tests or repair the semiconductor device, if it is repairable.

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