Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Rolf Bremensdorfer0
Christoph Merkl0
Markus Hauf0
Date of Patent
January 30, 2007
0Patent Application Number
105367880
Date Filed
November 13, 2003
0Patent Primary Examiner
Patent abstract
A method of producing a calibration wafer having at least a predetermined emissivity, including providing a wafer of semiconductor material; subjecting the bulk material of the wafer to doping with foreign atoms and/or generating lattice defects to obtain the predetermined emissivity; and coating the wafer to obtain a further optical characteristic.
Timeline
No Timeline data yet.
Further Resources
No Further Resources data yet.
