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US Patent 7139632 Enhanced process and profile simulator algorithms

Patent 7139632 was granted and assigned to Lam Research on November, 2006 by the United States Patent and Trademark Office.

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
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Current Assignee
Lam Research
Lam Research
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Date Filed
September 1, 2004
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Date of Patent
November 21, 2006
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Patent Application Number
10932926
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Patent Citations Received
‌
US Patent 11921433 Optical metrology in machine learning to characterize features
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‌
US Patent 11704463 Method of etch model calibration using optical scatterometry
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Patent Inventor Names
David Cooperberg
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Vahid Vahedi
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
7139632
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Patent Primary Examiner
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Leo Picard
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