US Patent 7046179 Apparatus and method for on-chip ADC calibration
Patent 7046179 was granted and assigned to National Semiconductor on May, 2006 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
March 30, 2004
0
Date of Patent
May 16, 2006
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Patent Application Number
10817322
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Patent Inventor Names
Maria R. Tursi
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Andreas Tuechler
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Christopher A. Menkus
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Ols Hidri
0
Robert C. Taft
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Valerie Pons
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Patent Jurisdiction
Patent Number
Patent Primary Examiner
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