Log in
Enquire now
‌

US Patent 12111207 Despeckling in optical measurement systems

Patent 12111207 was granted and assigned to Apple (company) on October, 2024 by the United States Patent and Trademark Office.

OverviewStructured DataIssuesContributors

Contents

Is a
Patent
Patent
0

Patent attributes

Patent Applicant
Apple (company)
Apple (company)
0
Current Assignee
Apple (company)
Apple (company)
0
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
0
Patent Number
121112070
Patent Inventor Names
Jason S Pelc0
Mark A. Arbore0
Matthew A Terrel0
Alexander F Sugarbaker0
David S Gere0
Thomas C Greening0
Date of Patent
October 8, 2024
0
Patent Application Number
182347940
Date Filed
August 16, 2023
0
Patent Citations
‌
US Patent 6932519 Optical device package
0
‌
US Patent 6935792 Optoelectronic package and fabrication method
0
‌
US Patent 6940182 Flip-chip package with underfill dam for stress control
0
‌
US Patent 6947639 Integrated polarization coupler
0
‌
US Patent 6952504 Three dimensional engineering of planar optical structures
0
‌
US Patent 6955481 Method and apparatus for providing parallel optoelectronic communication with an electronic device
0
‌
US Patent 6964881 Multi-chip wafer level system packages and methods of forming same
0
‌
US Patent 6969204 Optical package with an integrated lens and optical assemblies incorporating the package
0
...
Patent Primary Examiner
‌
Georgia Y Epps
0
CPC Code
‌
G01J 1/44
0
‌
G01J 2001/444
0
‌
G02B 6/43
0
Patent abstract

Embodiments are directed to optical measurement systems that utilize multiple emitters to emit light during a measurement, as well as methods of performing measurements using these optical measurement systems. The optical measurement systems may include a light generation assembly that is configured to generate light via a light source unit, and a photonic integrated circuit that includes a launch group having a plurality of emitters. Each of these emitters is optically coupled to the light generation assembly to receive light generated from the light generation assembly, and may emit this light from a surface of the photonic integrated circuit. The optical measurement system may perform a measurement in which the light generation assembly generates light and each of the plurality of emitters simultaneously emit light received from the light generation assembly.

Timeline

No Timeline data yet.

Further Resources

Title
Author
Link
Type
Date
No Further Resources data yet.

References

Find more entities like US Patent 12111207 Despeckling in optical measurement systems

Use the Golden Query Tool to find similar entities by any field in the Knowledge Graph, including industry, location, and more.
Open Query Tool
Access by API
Golden Query Tool
Golden logo

Company

  • Home
  • Press & Media
  • Blog
  • Careers
  • WE'RE HIRING

Products

  • Knowledge Graph
  • Query Tool
  • Data Requests
  • Knowledge Storage
  • API
  • Pricing
  • Enterprise
  • ChatGPT Plugin

Legal

  • Terms of Service
  • Enterprise Terms of Service
  • Privacy Policy

Help

  • Help center
  • API Documentation
  • Contact Us
By using this site, you agree to our Terms of Service.