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US Patent 12094931 Semiconductor device and method for manufacturing the same

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Is a
Patent
Patent
0

Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
0
Patent Number
120949310
Patent Inventor Names
Ronghui Hao0
King Yuen Wong0
Date of Patent
September 17, 2024
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Patent Application Number
170377680
Date Filed
September 30, 2020
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Patent Citations
‌
US Patent 10833159 Semiconductor device and method for manufacturing the same
0
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US Patent 9831331 Heterojunction-based HEMT transistor
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US Patent 10002956 High electron mobility transistor
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US Patent 7576373 Nitride semiconductor device and method for manufacturing the same
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US Patent 7728356 P-GaN/AlGaN/AlN/GaN enhancement-mode field effect transistor
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US Patent 8148752 Field effect transistor
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US Patent 8350294 Compensated gate MISFET and method for fabricating the same
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US Patent 8552471 Semiconductor apparatus having reverse blocking characteristics and method of manufacturing the same
0
...
Patent Primary Examiner
‌
Reema Patel
0
CPC Code
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H01L 29/7786
0
Patent abstract

A semiconductor device includes first and second nitride semiconductor layers, a source, a drain, a gate structure, first and second p-type doped nitride semiconductor compound islands. The second nitride semiconductor layer is disposed on the first nitride semiconductor layer and has a bandgap greater than that of the first nitride semiconductor layer. The source, the drain, and the gate structure are disposed on the second nitride semiconductor layer. The drain viewed in a direction normal to the second nitride semiconductor layer extends longitudinally in an extending direction. The gate structure is between the source and the drain. The first p-type doped nitride semiconductor compound islands are disposed on the second nitride semiconductor layer and arranged adjacent to the drain along the extending direction. The second p-type doped nitride semiconductor compound island is disposed between the gate structure and the second nitride semiconductor layer.

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