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US Patent 11965798 Endpoint detection system for enhanced spectral data collection

Patent 11965798 was granted and assigned to Applied Materials on April, 2024 by the United States Patent and Trademark Office.

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Contents

Is a
Patent
Patent
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Patent attributes

Patent Applicant
Applied Materials
Applied Materials
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Current Assignee
Applied Materials
Applied Materials
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
119657980
Patent Inventor Names
Pengyu Han0
Lei Lian0
Date of Patent
April 23, 2024
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Patent Application Number
173447910
Date Filed
June 10, 2021
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Patent Citations
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US Patent 11421977 Eliminating internal reflections in an interferometric endpoint detection system
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US Patent 7399711 Method for controlling a recess etch process
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US Patent 8115912 Polishing end point detection method, polishing end point detection apparatus, and polishing apparatus
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US Patent 8554356 Processing end point detection method, polishing method, and polishing apparatus
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US Patent 9176276 Imaging system for three-dimensional imaging of the interior of an object
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US Patent 11501986 Wafer profiling for etching system
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Patent Primary Examiner
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Maurice C Smith
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CPC Code
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G02B 6/06
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G02B 6/4204
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G02B 6/4246
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G02B 2006/12176
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G01B 11/0683
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G03F 7/70625
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G02B 27/30
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G02B 27/0025
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Patent abstract

An endpoint detection system for enhanced spectral data collection is provided. An optical bundle is coupled to a light source configured to generate incident light. The optical bundle includes two or more sets of optical fibers that each include an emitting optical fiber and a receiving optical fiber. The receiving optical fibers are disposed within the optical bundle at a pairing angle relative to a respective emitting optical fiber. The optical bundle is also coupled to a collimator assembly that includes an achromatic lens. The achromatic lens receives a first light beam of incident light from a first emitting optical fiber and directs spectral components of the first light beam to a first and second portion of a surface of a substrate. The first portion of the substrate surface is substantially the same as the second portion. The achromatic lens collects reflected spectral components that are produced by the spectral components directed to the first and second portions of the substrate surface. The achromatic lens transmits the reflected spectral components to a first receiving fiber of the optical fiber bundle, which transmits the reflected spectral components to a light detection component. A processing device coupled to the light detection component determines a reflectance of the substrate surface based on the reflected spectral components.

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