US Patent 11850677 Simultaneous pattern-scan placement during sample processing
Patent 11850677 was granted and assigned to Elemental Scientific Lasers, LLC on December, 2023 by the United States Patent and Trademark Office.
All edits
Edits on 27 Dec, 2023
Golden AI
Edits made to:
Infobox (+41 properties)
Article (+305 characters)
US Patent 11850677 Simultaneous pattern-scan placement during sample processing
Article
Patent abstract
A laser ablation system, and method, facilitates the execution of user-defined scans (i.e., in which a laser beam is scanned across a sample along a beam trajectory to ablate or dissociate a portion of the sample) and enables the user define additional scans while a scan is being executed.
Infobox
Is a
Patent Applicant
Current Assignee
Patent Jurisdiction
Patent Number
Patent Inventor Names
Ciaran O'Connor0
Erik Larsen0
Leif Summerfield0
Date of Patent
December 26, 2023
0Patent Application Number
154378040
Date Filed
January 10, 2017
0Patent Citations
Patent Primary Examiner
CPC Code
Find more entities like US Patent 11850677 Simultaneous pattern-scan placement during sample processing
Use the Golden Query Tool to find similar entities by any field in the Knowledge Graph, including industry, location, and more.
By using this site, you agree to our Terms of Service.