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US Patent 11756092 Flaw analysis of images

Patent 11756092 was granted and assigned to EBay on September, 2023 by the United States Patent and Trademark Office.

Overview Structured Data Issues Contributors Activity

Is a

Current Assignee

Date Filed

July 14, 2021

Date of Patent

September 12, 2023

Patent Applicant

Patent Application Number

17375207

Patent Citations

US Patent 11100550 Flaw analysis of images

US Patent 10783585 Agent-facilitated claims damage estimation

US Patent 7617128 Online transaction hosting apparatus and system

US Patent 7921052 Efficient online auction style listings that encourage out-of-channel negotiation

US Patent 8452691 System, program product, and methods for online image handling

US Patent 8635124 Message based generation of item listings

US Patent 10319014 Online marketplace system, method, and computer readable medium for providing flaw accentuation to an image of an item for sale

Patent Inventor Names

David Eramian

Justin VanWinkle

Sandy Godsey

Dane Glasgow

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

Patent Primary Examiner

William J Allen

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