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US Patent 11756092 Flaw analysis of images

Patent 11756092 was granted and assigned to EBay on September, 2023 by the United States Patent and Trademark Office.

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Contents

Is a
Patent
Patent

Patent attributes

Patent Applicant
EBay
EBay
Current Assignee
EBay
EBay
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
11756092
Patent Inventor Names
David Eramian
Justin VanWinkle
Sandy Godsey
Dane Glasgow
Date of Patent
September 12, 2023
Patent Application Number
17375207
Date Filed
July 14, 2021
Patent Citations
‌
US Patent 11100550 Flaw analysis of images
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US Patent 10783585 Agent-facilitated claims damage estimation
‌
US Patent 7617128 Online transaction hosting apparatus and system
‌
US Patent 7921052 Efficient online auction style listings that encourage out-of-channel negotiation
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US Patent 8452691 System, program product, and methods for online image handling
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US Patent 8635124 Message based generation of item listings
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US Patent 10319014 Online marketplace system, method, and computer readable medium for providing flaw accentuation to an image of an item for sale
Patent Primary Examiner
‌
William J Allen

Systems and methods are disclosed to provide flaw accentuation to an image in an e-commerce online marketplace. In some embodiments, a method may include receiving at an online marketplace, from a seller through the Internet, an image of an item being listed for sale at the online marketplace and text related to the item being listed for sale; determining that the item includes a flaw based on the text related to the item being listed for sale or the image of the item; creating a flaw accentuation to the image; and creating a listing in the online marketplace for the item that includes the image and the flaw accentuation to the image.

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