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US Patent 11685015 Method and system for performing chemical mechanical polishing

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Is a
Patent
Patent
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Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
116850150
Date of Patent
June 27, 2023
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Patent Application Number
162598560
Date Filed
January 28, 2019
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Patent Citations
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US Patent 9171929 Strained structure of semiconductor device and method of making the strained structure
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US Patent 9193027 Retainer ring
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US Patent 9406804 FinFETs with contact-all-around
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US Patent 9443769 Wrap-around contact
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US Patent 9548303 FinFET devices with unique fin shape and the fabrication thereof
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US Patent 9548366 Self aligned contact scheme
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US Patent 9564489 Multiple gate field-effect transistors having oxygen-scavenged gate stack
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US Patent 9576814 Method of spacer patterning to form a target integrated circuit pattern
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...
Patent Primary Examiner
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Christine A Enad
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CPC Code
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H01L 21/3212
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H01L 21/823431
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H01L 21/823437
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H01L 29/66545
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H01L 29/66795
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H01L 29/7851
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B24B 37/32
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B24B 37/10
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A method of using a polishing system includes securing a wafer in a carrier head, the carrier head including a housing enclosing the wafer, in which the housing includes a retainer ring recess and a retainer ring positioned in the retainer ring recess, the retainer ring surrounding the wafer, in which the retainer ring includes a main body portion and a bottom portion connected to the main body portion, and a bottom surface of the bottom portion includes at least one first engraved region and a first non-engraved region adjacent to the first engraved region; pressing the wafer against a polishing pad; and moving the carrier head or the polishing pad relative to the other.

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