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US Patent 11674882 Scanning infrared measurement system

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Is a
Patent
Patent
0

Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
116748820
Date of Patent
June 13, 2023
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Patent Application Number
176928760
Date Filed
March 11, 2022
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Patent Citations
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US Patent 9781918 Substrate unit, preservation device and method for the cryopreservation of a biological sample
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US Patent 10175159 Use of vibrational spectroscopy for DNA content inspection
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US Patent 10180388 Scanning infrared measurement system
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US Patent 10216144 Multiple laminar flow-based particle and cellular separation with laser steering
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US Patent 10315194 Chip device and a particle analyzing apparatus
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US Patent 11187224 Microfluidic chip
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US Patent 11243494 Multiple laminar flow-based particle and cellular separation with laser steering
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US Patent 7104405 Method and apparatus for sorting particles
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...
Patent Primary Examiner
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David P Porta
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CPC Code
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G01N 21/35
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G01N 2015/0065
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G02B 21/0032
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An analyzer of a component in a sample fluid includes an optical source and an optical detector defining a beam path of a beam, wherein the optical source emits the beam and the optical detector measures the beam after partial absorption by the sample fluid, a fluid flow cell disposed on the beam path defining an interrogation region in the a fluid flow cell in which the optical beam interacts with the sample fluid and a reference fluid; and wherein the sample fluid and the reference fluid are in laminar flow, and a scanning system that scans the beam relative to the laminar flow within the fluid flow cell, wherein the scanning system scans the beam relative to both the sample fluid and the reference fluid.

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