US Patent 11630450 Quality control device, quality control method, and program
Patent 11630450 was granted and assigned to Fujifilm on April, 2023 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
December 9, 2020
0
Date of Patent
April 18, 2023
0
Patent Applicant
Patent Application Number
17117097
0
Patent Inventor Names
Yu Tokuno
0
Shinichi Sugawara
0
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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