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US Patent 11630450 Quality control device, quality control method, and program

Patent 11630450 was granted and assigned to Fujifilm on April, 2023 by the United States Patent and Trademark Office.

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Contents

Is a
Patent
Patent
0

Patent attributes

Patent Applicant
Fujifilm
Fujifilm
0
Current Assignee
Fujifilm
Fujifilm
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
116304500
Patent Inventor Names
Yu Tokuno0
Shinichi Sugawara0
Date of Patent
April 18, 2023
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Patent Application Number
171170970
Date Filed
December 9, 2020
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Patent Primary Examiner
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Yoshihisa Ishizuka
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CPC Code
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G05B 19/41885
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G05B 2219/32368
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G05B 2219/32179
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G05B 23/0294
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G05B 23/0262
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G05B 13/0265
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G05B 23/0227
0
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G05B 23/0264
0
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A quality control device that controls quality of a product manufactured through a plurality of processes, includes a prediction model generation unit that generates a prediction model to predict quality of a product with respect to unknown process data by performing learning using known process data obtained from the plurality of processes and a measured value of quality of the product with respect to the known process data as learning data; a quality prediction unit that derives a predictive value of quality of each of a plurality of products, which are manufactured after the prediction model is generated, on the basis of the prediction model using process data of the plurality of products as input data; and an inspection target decision unit that decides the product for which the predictive value having the smallest margin with respect to a preset standard is obtained as an inspection target, among the plurality of predictive values of quality obtained by the quality prediction unit.

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