US Patent 11100550 Flaw analysis of images
Patent 11100550 was granted and assigned to EBay on August, 2021 by the United States Patent and Trademark Office.
Is a
Current Assignee
0
Date Filed
May 1, 2019
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Date of Patent
August 24, 2021
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Patent Applicant
0
Patent Application Number
20190501
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Patent Citations Received
Patent Inventor Names
Dane Glasgow
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David Eramian
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Justin VanWinkle
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Sandy Godsey
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Patent Jurisdiction
Patent Number
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