US Patent 11038602 On-chip jitter evaluation for SerDes

An illustrative integrated circuit and method providing on-chip jitter evaluation. One illustrative integrated circuit embodiment includes a digital receiver having a timing recovery circuit that determines a phase offset signal from estimated timing errors of previous sampling instants; and an on-chip memory that captures the phase offset signal, the on-chip memory being coupled to a processor that derives one or more jitter measurements from the phase offset signal. For initial calibration, the processor may configure the receiver for loop back operation, and thereafter the calibration values may enable evaluation of remote transmitter clock jitter.