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US Patent 10861676 Metal recess for semiconductor structures
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Patent
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Applied Materials
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Date Filed
March 5, 2018
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Date of Patent
December 8, 2020
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Patent Applicant
Applied Materials
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Patent Application Number
15912404
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Patent Citations
US Patent 10062578 Methods for etch of metal and metal-oxide films
US Patent 10062579 Selective SiN lateral recess
US Patent 10062585 Oxygen compatible plasma source
US Patent 10062587 Pedestal with multi-zone temperature control and multiple purge capabilities
US Patent 10083830 Substrate cleaning method for removing oxide film
US Patent 10121689 Moment cancelling pad raising mechanism in wafer positioning pedestal for semiconductor processing
US Patent 10147620 Bolted wafer chuck thermal management systems and methods for wafer processing systems
US Patent 10147736 Semiconductor memory device and method for manufacturing same
US Patent 10256079 Semiconductor processing systems having multiple plasma configurations
US Patent 10269541 Workpiece processing chamber having a thermal controlled microwave window
•••
Patent Jurisdiction
United States Patent and Trademark Office
0
Patent Number
10861676
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Patent Primary Examiner
Jeremy Carroll
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