Log in
Sign up
Golden has been acquired by ComplyAdvantage.Read about it here ⟶
‌

US Patent 10769320 Integrated use of model-based metrology and a process model

Patent 10769320 was granted and assigned to KLA-Tencor on September, 2020 by the United States Patent and Trademark Office.

OverviewStructured DataIssuesContributorsActivity

All edits

Edits on 17 Oct, 2024
"update inverses"
Golden AI profile picture
Golden AI
edited on 17 Oct, 2024
Edits made to:
Infobox (+1 properties)
Infobox
Patent Citations Received
‌
US Patent 12117810 AI-based determination of action plan for manufacturing component carriers
0
"update inverses"
Golden AI profile picture
Golden AI
edited on 16 Oct, 2024
Edits made to:
Infobox (+1 properties)
Infobox
Patent Citations Received
‌
US Patent 12117347 Metrology target design for tilted device designs
0
Edits on 2 Aug, 2023
"update inverses"
Golden AI profile picture
Golden AI
edited on 2 Aug, 2023
Edits made to:
Infobox (+1 properties)
Infobox
Patent Citations Received
‌
US Patent 11713959 Overlay metrology using spectroscopic phase
0
Edits on 18 May, 2023
"Remove website redirecting to Patent Public Search front page"
Golden AI profile picture
Golden AI
edited on 18 May, 2023
Edits made to:
Infobox (-1 properties)
Infobox
Official Website
https://pdfpiw.uspto.gov/.piw?Docid=107693200
Edits on 3 Apr, 2023
"update citations for inverse infoboxes"
Golden AI profile picture
Golden AI
edited on 3 Apr, 2023
Edits on 1 Apr, 2023
"update citations for inverse infoboxes"
Golden AI profile picture
Golden AI
edited on 1 Apr, 2023
"Entity importer update"
Golden AI profile picture
Golden AI
edited on 1 Apr, 2023
Edits on 15 Mar, 2023
"update inverses"
Golden AI profile picture
Golden AI
edited on 15 Mar, 2023
Edits made to:
Infobox (+1 properties)
Infobox
Patent Citations Received
‌
US Patent 11604063 Self-calibrated overlay metrology using a skew training sample
0
Edits on 25 Sep, 2022
"update citations for inverse infoboxes"
Golden AI profile picture
Golden AI
edited on 25 Sep, 2022
Edits on 23 Sep, 2022
"update citations for inverse infoboxes"
Golden AI profile picture
Golden AI
edited on 23 Sep, 2022
Edits on 8 Jun, 2022
"Entity importer update"
Golden AI profile picture
Golden AI
edited on 8 Jun, 2022
Edits made to:
Infobox (+1 properties)
Infobox
Website URL
https://pdfpiw.uspto.gov/.piw?Docid=10769320
Edits on 18 May, 2022
"update inverses"
Golden AI profile picture
Golden AI
edited on 18 May, 2022
Edits made to:
Infobox (+1 properties)
Infobox
Patent citations received
‌
US Patent 11309202 Overlay metrology on bonded wafers
Edits on 12 Feb, 2022
"update inverses"
Golden AI profile picture
Golden AI
edited on 12 Feb, 2022
Edits made to:
Infobox (+1 properties)
Infobox
Patent citations received
‌
US Patent 11043239 Magneto-optic Kerr effect metrology systems
Edits on 12 Feb, 2022
"update inverses"
Golden AI profile picture
Golden AI
edited on 12 Feb, 2022
Edits on 6 Feb, 2022
"Created via: Entity Importer"
Golden AI profile picture
Golden AI
created this topic on 6 Feb, 2022
Edits made to:
Infobox (+9 properties)
‌

 US Patent 10769320 Integrated use of model-based metrology and a process model

Infobox
Is a
Patent
Patent
Patent applicant
KLA-Tencor
KLA-Tencor
Current assignee
KLA-Tencor
KLA-Tencor
Patent jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent number
10769320
Date of patent
September 8, 2020
Patent application number
14107850
Date Filed
December 16, 2013
Patent primary examiner
‌
Gregory J. Toatley, Jr

Find more entities like US Patent 10769320 Integrated use of model-based metrology and a process model

Use the Golden Query Tool to find similar entities by any field in the Knowledge Graph, including industry, location, and more.
Open Query Tool
Access by API
Golden Query Tool
Golden logo
By using this site, you agree to our Terms of Service.