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US Patent 10673453 Delay-based residue stage

Patent 10673453 was granted and assigned to Texas Instruments on June, 2020 by the United States Patent and Trademark Office.

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Patent Citations Received
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US Patent 12074607 Analog-to-digital converter (ADC) having linearization circuit with reconfigurable lookup table (LUT) memory and calibration options
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US Patent 11962318 Calibration scheme for a non-linear ADC
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US Patent 11881867 Calibration scheme for filling lookup table in an ADC
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US Patent 11784660 Auxiliary ADC-based calibration for non-linearity correction of ADC
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Official Website
https://pdfpiw.uspto.gov/.piw?Docid=106734530
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Infobox
Is a
Patent
Patent
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Patent Applicant
Texas Instruments
Texas Instruments
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Current Assignee
Texas Instruments
Texas Instruments
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
106734530
Date of Patent
June 2, 2020
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Patent Application Number
165177960
Date Filed
July 22, 2019
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Official Website
https://pdfpiw.uspto.gov/.piw?Docid=106734530
Patent Citations
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US Patent 10003353 Time-based delay line analog comparator
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Patent Citations Received
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US Patent 11309903 Sampling network with dynamic voltage detector for delay output
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US Patent 11316505 Delay based comparator
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US Patent 11316525 Lookup-table-based analog-to-digital converter
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US Patent 11316526 Piecewise calibration for highly non-linear multi-stage analog-to-digital converter
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US Patent 11387840 Delay folding system and method
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US Patent 11424758 Conversion and folding circuit for delay-based analog-to-digital converter system
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US Patent 11438001 Gain mismatch correction for voltage-to-delay preamplifier array
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US Patent 11595053 Analog-to-digital converter with interpolation
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Patent Primary Examiner
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Joseph J Lauture
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US Patent 11595053 Analog-to-digital converter with interpolation
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Patent Citations Received
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US Patent 11316505 Delay based comparator
0
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