US Patent 10663504 Field-biased second harmonic generation metrology
Patent 10663504 was granted and assigned to Femtometrix, Inc. on May, 2020 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
October 31, 2017
Date of Patent
May 26, 2020
Patent Applicant
Patent Application Number
15799594
Patent Citations Received
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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