US Patent 10565046 Fault detection using data distribution characteristics

Certain embodiments may include a method, system, apparatus, and/or machine accessible storage medium to: obtain baseline data associated with a device, wherein the baseline data comprises an indication of an expected performance of the device during healthy operation; obtain status data associated with the device, wherein the status data is obtained based on operational information monitored by a sensor; compute delta data based on a delta between the status data and the baseline data; compute a standard deviation of the delta data; compute a plurality of standard deviation bands based on the standard deviation of the delta data; compute a statistical distribution of the delta data based on the plurality of standard deviation bands; and detect a fault in the device based on the statistical distribution of the delta data.