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US Patent 10520532 Low frequency noise measuring apparatus with electromagnetic shielding characteristics

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US Patent 12004336 System and method for thermal management and electromagnetic interference management
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US Patent 11906438 System and method for optical state determination
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Patent abstract

The present invention relates to an apparatus for measuring low frequency noise having shielding characteristics, and enhance the accuracy of measurement of low frequency noise of a sample by blocking the flow of electromagnetic waves in the gap between the chamber and the door.

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Soo Min Lee0
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US Patent 11644425 System and method for optical state determination
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