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US Patent 10520532 Low frequency noise measuring apparatus with electromagnetic shielding characteristics

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Is a
Patent
Patent
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Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
0
Patent Number
105205320
Patent Inventor Names
Soo Min Lee0
Date of Patent
December 31, 2019
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Patent Application Number
160737560
Date Filed
July 13, 2017
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Patent Citations Received
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US Patent 12004336 System and method for thermal management and electromagnetic interference management
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US Patent D965448 Test box
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US Patent D968236 Test box
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US Patent 11378608 System and method for device state determination
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US Patent 11399450 System and method for managing electromagnetic interference
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US Patent 11906438 System and method for optical state determination
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US Patent D965449 Test box
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US Patent 10869415 System and method for operating electromagnetically isolated device
...
Patent Primary Examiner
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Hung V. Ngo
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Patent abstract

The present invention relates to an apparatus for measuring low frequency noise having shielding characteristics, and enhance the accuracy of measurement of low frequency noise of a sample by blocking the flow of electromagnetic waves in the gap between the chamber and the door.

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