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US Patent 10412283 Dual aperture 3D camera and method using differing aperture areas

Patent 10412283 was granted and assigned to trinamiX GmbH on September, 2019 by the United States Patent and Trademark Office.

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
1
Current Assignee
trinamiX GmbH
trinamiX GmbH
1
Date Filed
September 14, 2016
1
Date of Patent
September 10, 2019
1
Patent Applicant
trinamiX GmbH
trinamiX GmbH
1
Patent Application Number
15758135
1
Patent Citations
‌
US Patent 10120078 Detector having a transversal optical sensor and a longitudinal optical sensor
‌
US Patent 10094927 Detector for optically determining a position of at least one object
‌
US Patent 10012532 Optical detector
Patent Citations Received
‌
US Patent 12115583 Systems and methods for adhesive-based part retention features in additively manufactured structures
7
‌
US Patent 11504912 Selective end effector modular attachment device
8
‌
US Patent 11860292 Detector and methods for authenticating at least one object
9
‌
US Patent 11865617 Methods and apparatuses for wide-spectrum consumption of output of atomization processes across multi-process and multi-scale additive manufacturing modalities
10
‌
US Patent 11885000 In situ thermal treatment for PBF systems
11
‌
US Patent 11884025 Three-dimensional printer and methods for assembling parts via integration of additive and conventional manufacturing operations
12
‌
US Patent 12083596 Thermal elements for disassembly of node-based adhesively bonded structures
13
‌
US Patent 12090551 Removal of supports, and other materials from surface, and within hollow 3D printed parts
14
‌
US Patent 11479015 Custom formed panels for transport structures and methods for assembling same
‌
US Patent 11529741 System and method for positioning one or more robotic apparatuses
17
•••
Patent Inventor Names
Ingmar Bruder
1
Robert Send
1
Stephan Irle
1
Erwin Thiel
1
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
1
Patent Number
10412283
1
Patent Primary Examiner
‌
Jamie J Atala
1
Industry
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