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US Patent 10216565 Root cause analysis

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
Date Filed
December 11, 2017
Date of Patent
February 26, 2019
Patent Application Number
15836973
Patent Citations Received
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US Patent 11240385 Defect detection for multi-function devices using machine learning
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US Patent 10970158 Root cause analysis
0
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US Patent 11516355 Defect detection for multi-function devices using machine learning
0
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US Patent 11483435 Machine state and defect detection meta data to execute maintenance routines on a multi-function device
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US Patent 11249883 Error repair tool using sentiment analysis
Patent Inventor Names
Jonathan Dunne
0
Asima Silva
0
Hernan A. Cunico
0
Jeremiah O'Connor
0
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
10216565
Patent Primary Examiner
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Bryce P Bonzo

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