US Patent 11516355 Defect detection for multi-function devices using machine learning

A method is disclosed. For example, the method executed by a processor of a multi-function device (MFD) includes executing a defect learning routine to identify defects, cataloging the defects based on a job function, a type of paper, and a machine state, receiving a job request, determining a known defect that has been catalogued based on the job function, the type of paper, and the machine state, and presenting a visualization of the known defect on a display of a user interface before executing the job request.