Log in
Enquire now
‌

US Patent 10055533 Visualization of analysis process parameters for layout-based checks

Patent 10055533 was granted and assigned to Mentor Graphics on August, 2018 by the United States Patent and Trademark Office.

OverviewStructured DataIssuesContributors
Patent abstract

Techniques and mechanisms for marking the parameters of a circuit analysis process for visual identification are disclosed. The visually-identified parameters can then be employed with the results of the circuit analysis to debug the layout design.

Timeline

No Timeline data yet.

Further Resources

Title
Author
Link
Type
Date
No Further Resources data yet.

References

Find more entities like US Patent 10055533 Visualization of analysis process parameters for layout-based checks

Use the Golden Query Tool to find similar entities by any field in the Knowledge Graph, including industry, location, and more.
Open Query Tool
Access by API
Golden Query Tool
Golden logo
By using this site, you agree to our Terms of Service.