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US Patent 10037933 Test socket assembly and related methods

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
0
Date Filed
June 18, 2015
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Date of Patent
July 31, 2018
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Patent Application Number
14743879
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Patent Citations Received
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US Patent 11415626 Method and apparatus comprising a semiconductor device and test apparatus
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US Patent 10274515 Waveguide integrated testing
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US Patent 10698000 Waveguide integrated testing
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US Patent 10884023 Test fixture for observing current flow through a set of resistors
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US Patent 11635461 Test apparatus and method for testing a semiconductor device
0
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US Patent 11360117 Waveguide integrated circuit testing
Patent Inventor Names
Jason Mroczkowski
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Mitchell Nelson
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Valts Treibergs
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
10037933
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Patent Primary Examiner
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Tung X Nguyen
0

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