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US Patent 10037933 Test socket assembly and related methods

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Contents

Is a
Patent
Patent
1

Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
1
Patent Number
100379331
Patent Inventor Names
Jason Mroczkowski1
Mitchell Nelson1
Valts Treibergs1
Date of Patent
July 31, 2018
1
Patent Application Number
147438791
Date Filed
June 18, 2015
1
Patent Citations Received
‌
US Patent 11415626 Method and apparatus comprising a semiconductor device and test apparatus
‌
US Patent 10274515 Waveguide integrated testing
1
‌
US Patent 10698000 Waveguide integrated testing
‌
US Patent 10884023 Test fixture for observing current flow through a set of resistors
‌
US Patent 11635461 Test apparatus and method for testing a semiconductor device
6
‌
US Patent 11360117 Waveguide integrated circuit testing
Patent Primary Examiner
‌
Tung X Nguyen
1
Patent abstract

A socket assembly including a housing that has one or more spring probes therein. The socket assembly further includes a leadframe assembly that has one or more cantilever members, and the leadframe assembly has microwave structures and a flexible ground plane. The socket assembly further includes an elastomeric spacer adjacent the leadframe assembly, the elastomeric spacer having one or more holes receiving the spring probes therethrough.

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