PROGENY SYSTEMS CORPORATION SBIR Phase II Award, April 2018

Recent Navy research has indicated that the Accelerated Life Testing (ALT) protocols have in some cases overestimated accelerated aging by a factor of ten, meaning that a component may fail in two years rather than the twenty years certified. This topic involves an investigation of the accuracy of the accelerated life testing protocols for Cathodic Delamination (CD) resistance utilized by the Navy acquisition community for first article testing of a wide variety of naval hardware. The research will include the development of FEA modeling that will predict CD accelerated life testing protocols, and possible CD mitigation strategies and techniques and determine the effectiveness of new approaches for combating CD.