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List of Qcept Technologies patents

List of Qcept Technologies patents
List of Florida A&M University patents
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Founders educated at Central South University
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Patents where
Current Assignee
Name
is
Qcept TechnologiesQcept Technologies
Name
Description
Patent Applicant
Current Assignee
Inventor
Patent Jurisdiction
Patent Number
Date of Patent
‌
US Patent 7659734 Semiconductor inspection system and apparatus utilizing a non-vibrating contact potential difference sensor and controlled illumination

Patent 7659734 was granted and assigned to Qcept Technologies on February, 2010 by the United States Patent and Trademark Office.

Qcept Technologies
Qcept Technologies
United States Patent and Trademark Office
United States Patent and Trademark Office
7659734
February 9, 2010
‌
US Patent 7634365 Inspection system and apparatus

Patent 7634365 was granted and assigned to Qcept Technologies on December, 2009 by the United States Patent and Trademark Office.

Qcept Technologies
Qcept Technologies
United States Patent and Trademark Office
United States Patent and Trademark Office
7634365
December 15, 2009
‌
US Patent 7107158 Inspection system and apparatus

Patent 7107158 was granted and assigned to Qcept Technologies on September, 2006 by the United States Patent and Trademark Office.

Qcept Technologies
Qcept Technologies
United States Patent and Trademark Office
United States Patent and Trademark Office
7107158
September 12, 2006
‌
US Patent 7092826 Semiconductor wafer inspection system

Patent 7092826 was granted and assigned to Qcept Technologies on August, 2006 by the United States Patent and Trademark Office.

Qcept Technologies
Qcept Technologies
United States Patent and Trademark Office
United States Patent and Trademark Office
7092826
August 15, 2006
‌
US Patent 7379826 Semiconductor wafer inspection system

Patent 7379826 was granted and assigned to Qcept Technologies on May, 2008 by the United States Patent and Trademark Office.

Qcept Technologies
Qcept Technologies
United States Patent and Trademark Office
United States Patent and Trademark Office
7379826
May 27, 2008
‌
US Patent 7103482 Inspection system and apparatus

Patent 7103482 was granted and assigned to Qcept Technologies on September, 2006 by the United States Patent and Trademark Office.

Qcept Technologies
Qcept Technologies
United States Patent and Trademark Office
United States Patent and Trademark Office
7103482
September 5, 2006
‌
US Patent 7308367 Wafer inspection system

Patent 7308367 was granted and assigned to Qcept Technologies on December, 2007 by the United States Patent and Trademark Office.

Qcept Technologies
Qcept Technologies
United States Patent and Trademark Office
United States Patent and Trademark Office
7308367
December 11, 2007
‌
US Patent 7152476 Measurement of motions of rotating shafts using non-vibrating contact potential difference sensor

Patent 7152476 was granted and assigned to Qcept Technologies on December, 2006 by the United States Patent and Trademark Office.

Qcept Technologies
Qcept Technologies
United States Patent and Trademark Office
United States Patent and Trademark Office
7152476
December 26, 2006
‌
US Patent 7900526 Defect classification utilizing data from a non-vibrating contact potential difference sensor

Patent 7900526 was granted and assigned to Qcept Technologies on March, 2011 by the United States Patent and Trademark Office.

Qcept Technologies
Qcept Technologies
United States Patent and Trademark Office
United States Patent and Trademark Office
7900526
March 8, 2011
‌
US Patent 7752000 Calibration of non-vibrating contact potential difference measurements to detect surface variations that are perpendicular to the direction of sensor motion

Patent 7752000 was granted and assigned to Qcept Technologies on July, 2010 by the United States Patent and Trademark Office.

Qcept Technologies
Qcept Technologies
United States Patent and Trademark Office
United States Patent and Trademark Office
7752000
July 6, 2010
‌
US Patent 7337076 Inspection system and apparatus

Patent 7337076 was granted and assigned to Qcept Technologies on February, 2008 by the United States Patent and Trademark Office.

Qcept Technologies
Qcept Technologies
United States Patent and Trademark Office
United States Patent and Trademark Office
7337076
February 26, 2008
‌
US Patent 8275564 Patterned wafer inspection system using a non-vibrating contact potential difference sensor

Qcept Technologies
Qcept Technologies
United States Patent and Trademark Office
United States Patent and Trademark Office
8275564
September 25, 2012
‌
US Patent 6957154 Semiconductor wafer inspection system

Patent 6957154 was granted and assigned to Qcept Technologies on October, 2005 by the United States Patent and Trademark Office.

Qcept Technologies
Qcept Technologies
United States Patent and Trademark Office
United States Patent and Trademark Office
6957154
October 18, 2005
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13 results
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