List of Johnstech International patents

Patents where

Current Assignee

Name

‌

Johnstech International

Name	Description	Patent Applicant	Current Assignee	Patent Jurisdiction	Patent Number	Date of Patent
‌ US Patent 11293968 Integrated circuit testing for integrated circuits with antennas	Patent 11293968 was granted and assigned to Johnstech International on April, 2022 by the United States Patent and Trademark Office.	‌ Johnstech International	‌ Johnstech International	United States Patent and Trademark Office	11293968	April 5, 2022
‌ US Patent 7202657 Manual actuator for loading leadless microcircuit packages in a circuit tester	Patent 7202657 was granted and assigned to Johnstech International on April, 2007 by the United States Patent and Trademark Office.		‌ Johnstech International	United States Patent and Trademark Office	7202657	April 10, 2007
‌ US Patent 7338293 Circuit contact to test apparatus	Patent 7338293 was granted and assigned to Johnstech International on March, 2008 by the United States Patent and Trademark Office.		‌ Johnstech International	United States Patent and Trademark Office	7338293	March 4, 2008
‌ US Patent 9476936 Thermal management for microcircuit testing system	Patent 9476936 was granted and assigned to Johnstech International on October, 2016 by the United States Patent and Trademark Office.	‌ Johnstech International	‌ Johnstech International	United States Patent and Trademark Office	9476936	October 25, 2016
‌ US Patent 9500673 Electrically conductive kelvin contacts for microcircuit tester	Patent 9500673 was granted and assigned to Johnstech International on November, 2016 by the United States Patent and Trademark Office.	‌ Johnstech International	‌ Johnstech International	United States Patent and Trademark Office	9500673	November 22, 2016
‌ US Patent 6861667 Grounding inserts	Patent 6861667 was granted and assigned to Johnstech International on March, 2005 by the United States Patent and Trademark Office.		‌ Johnstech International	United States Patent and Trademark Office	6861667	March 1, 2005
‌ US Patent 9606143 Electrically conductive pins for load boards lacking Kelvin capability for microcircuit testing	Patent 9606143 was granted and assigned to Johnstech International on March, 2017 by the United States Patent and Trademark Office.	‌ Johnstech International	‌ Johnstech International	United States Patent and Trademark Office	9606143	March 28, 2017
‌ US Patent 6876213 Compliant actuator for IC test fixtures	Patent 6876213 was granted and assigned to Johnstech International on April, 2005 by the United States Patent and Trademark Office.		‌ Johnstech International	United States Patent and Trademark Office	6876213	April 5, 2005
‌ US Patent 7255576 Kelvin contact module for a microcircuit test system	Patent 7255576 was granted and assigned to Johnstech International on August, 2007 by the United States Patent and Trademark Office.		‌ Johnstech International	United States Patent and Trademark Office	7255576	August 14, 2007
‌ US Patent 10247755 Electrically conductive kelvin contacts for microcircuit tester	Patent 10247755 was granted and assigned to Johnstech International on April, 2019 by the United States Patent and Trademark Office.	‌ Johnstech International	‌ Johnstech International	United States Patent and Trademark Office	10247755	April 2, 2019
‌ US Patent 8988090 Electrically conductive kelvin contacts for microcircuit tester	Patent 8988090 was granted and assigned to Johnstech International on March, 2015 by the United States Patent and Trademark Office.		‌ Johnstech International	United States Patent and Trademark Office	8988090	March 24, 2015
‌ US Patent 7074049 Kelvin contact module for a microcircuit test system	Patent 7074049 was granted and assigned to Johnstech International on July, 2006 by the United States Patent and Trademark Office.		‌ Johnstech International	United States Patent and Trademark Office	7074049	July 11, 2006
‌ US Patent 8354854 Microcircuit testing interface having kelvin and signal contacts within a single slot	Patent 8354854 was granted and assigned to Johnstech International on January, 2013 by the United States Patent and Trademark Office.		‌ Johnstech International	United States Patent and Trademark Office	8354854	January 15, 2013
‌ US Patent 7639026 Electronic device test set and contact used therein	Patent 7639026 was granted and assigned to Johnstech International on December, 2009 by the United States Patent and Trademark Office.		‌ Johnstech International	United States Patent and Trademark Office	7639026	December 29, 2009
‌ US Patent 11360117 Waveguide integrated circuit testing	Patent 11360117 was granted and assigned to Johnstech International on June, 2022 by the United States Patent and Trademark Office.	‌ Johnstech International	‌ Johnstech International	United States Patent and Trademark Office	11360117	June 14, 2022
‌ US Patent 11307232 Waveguide integrated circuit testing	Patent 11307232 was granted and assigned to Johnstech International on April, 2022 by the United States Patent and Trademark Office.	‌ Johnstech International	‌ Johnstech International	United States Patent and Trademark Office	11307232	April 19, 2022
‌ US Patent 11467183 Integrated circuit contact test apparatus with and method of construction		‌ Johnstech International	‌ Johnstech International	United States Patent and Trademark Office	11467183	October 11, 2022
‌ US Patent 9696347 Testing apparatus and method for microcircuit and wafer level IC testing	Patent 9696347 was granted and assigned to Johnstech International on July, 2017 by the United States Patent and Trademark Office.	‌ Johnstech International	‌ Johnstech International	United States Patent and Trademark Office	9696347	July 4, 2017
‌ US Patent 10274515 Waveguide integrated testing	Patent 10274515 was granted and assigned to Johnstech International on April, 2019 by the United States Patent and Trademark Office.	‌ Johnstech International	‌ Johnstech International	United States Patent and Trademark Office	10274515	April 30, 2019
‌ US Patent 9007082 Electrically conductive pins for microcircuit tester	Patent 9007082 was granted and assigned to Johnstech International on April, 2015 by the United States Patent and Trademark Office.		‌ Johnstech International	United States Patent and Trademark Office	9007082	April 14, 2015
‌ US Patent 10067164 Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin rings	Patent 10067164 was granted and assigned to Johnstech International on September, 2018 by the United States Patent and Trademark Office.	‌ Johnstech International	‌ Johnstech International	United States Patent and Trademark Office	10067164	September 4, 2018
‌ US Patent 9297832 Electrically conductive pins for microcircuit tester	Patent 9297832 was granted and assigned to Johnstech International on March, 2016 by the United States Patent and Trademark Office.	‌ Johnstech International	‌ Johnstech International	United States Patent and Trademark Office	9297832	March 29, 2016
‌ US Patent 10698000 Waveguide integrated testing		‌ Johnstech International	‌ Johnstech International	United States Patent and Trademark Office	10698000	June 30, 2020
‌ US Patent 11209458 Integrated circuit contactor for testing ICs and method of construction	Patent 11209458 was granted and assigned to Johnstech International on December, 2021 by the United States Patent and Trademark Office.	‌ Johnstech International	‌ Johnstech International	United States Patent and Trademark Office	11209458	December 28, 2021
‌ US Patent 9429591 On-center electrically conductive pins for integrated testing	Patent 9429591 was granted and assigned to Johnstech International on August, 2016 by the United States Patent and Trademark Office.	‌ Johnstech International	‌ Johnstech International	United States Patent and Trademark Office	9429591	August 30, 2016

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