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US Patent 7639026 Electronic device test set and contact used therein

Patent 7639026 was granted and assigned to Johnstech International on December, 2009 by the United States Patent and Trademark Office.

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Patent
Patent

Patent attributes

Current Assignee
‌
Johnstech International
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
7639026
Date of Patent
December 29, 2009
Patent Application Number
11677870
Date Filed
February 22, 2007
Patent Citations Received
‌
US Patent 11906576 Contact assembly array and testing system having contact assembly array
0
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US Patent 11867752 Contact assembly and kelvin testing system having contact assembly
0
Patent Primary Examiner
‌
Ha Tran T Nguyen
Patent abstract

A contact for use in a test set which can be mounted to a load board of a tester apparatus. The contact, which serves to electrically connect at least one lead of a device being tested with a corresponding metallic trace on the load board, has a first end defining multiple contact points. As the contact is rotated about an axis generally perpendicular to a plane defined by the contact, successive contact points are sequentially engaged by a lead of the device being tested.

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