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US Patent RE49997 Metrological scanning probe microscope

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
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Date Filed
July 1, 2021
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Date of Patent
June 4, 2024
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Patent Application Number
17365671
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Patent Citations
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US Patent 8443459 Fast-scanning SPM scanner and method of operating same
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US Patent 9383386 Optical beam positioning unit for atomic force microscope
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US Patent 8458810 Scanning thermal twisting atomic force microscopy
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US Patent 10054612 Optical beam positioning unit for atomic force microscope
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US Patent 7497613 Probe with embedded heater for nanoscale analysis
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US Patent 8370960 Modular atomic force microscope
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Patent Inventor Names
Deron Walters
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Jason Cleveland
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Roger Proksch
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Aleksander Labuda
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
RE49997
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Patent Primary Examiner
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James A Menefee
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CPC Code
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G01Q 10/065
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G01Q 60/38
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G01Q 20/02
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