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US Patent 9976971 Systems and methods for X-ray diffraction

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Patent
Patent

Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
9976971
Patent Inventor Names
David U. Furrer2
Iuliana Cernatescu2
Date of Patent
May 22, 2018
Patent Application Number
14639460
Date Filed
March 5, 2015
Patent Citations Received
‌
US Patent 12011308 Imaging system
1
Patent Primary Examiner
‌
Allen C. Ho
Patent abstract

An x-ray diffraction system includes an x-ray source having a first interchangeable x-ray generating component, a second interchangeable x-ray generating component, an actuator and a controller operatively connected to the actuator. The first and second interchangeable x-ray generating components are interchangeable with one another. The actuator is operatively connected to the first and second interchangeable x-ray generating components. A method for non-destructive x-ray diffraction includes emitting a first x-ray beam from an x-ray source with a first interchangeable x-ray generating component based on a first desired depth to measure a crystallographic signature of a sample at the first desired depth, interchanging the first interchangeable x-ray generating component with a second interchangeable x-ray generating component to form a modified x-ray source, and emitting a second x-ray beam from the modified x-ray source based on a second desired depth, to non-destructively measure a crystallographic signature of the sample at the second desired depth.

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