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US Patent 9974435 Quality control method for optometric measurements

Patent 9974435 was granted and assigned to Essilor on May, 2018 by the United States Patent and Trademark Office.

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
Current Assignee
Essilor
Essilor
Date Filed
October 17, 2014
Date of Patent
May 22, 2018
Patent Applicant
Essilor
Essilor
Patent Application Number
15034301
Patent Citations Received
‌
US Patent 12013594 Method for detecting a probable error in a set of data relative to a wearer and/or a frame chosen by the wearer
0
Patent Inventor Names
Ahmed Haddadi
0
Loic Levraud
0
Marie-Anne Berthezene
0
Sebastien Gayat
0
Benjamin Rousseau
0
Cecile Petignaud
0
Fabien Divo
0
Isabelle Poulain
0
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
9974435
Patent Primary Examiner
‌
Jordan Schwartz

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