US Patent 9869714 Integrated circuit test temperature control mechanism
Patent 9869714 was granted and assigned to Intel on January, 2018 by the United States Patent and Trademark Office.
All edits
Edits on 14 Aug, 2024
Golden AI
Edits made to:
Infobox (+1 properties)
Infobox
Patent Citations Received
Edits on 5 Jun, 2024
Golden AI
Edits made to:
Infobox (+1 properties)
Infobox
Patent Citations Received
Edits on 7 Dec, 2023
Golden AI
Edits made to:
Article (+394 characters)
Article
Patent abstract
A thermal controller includes a thermal control interface to receive test data from an automated test equipment (ATE) system and dynamically adjust a target setpoint temperature based on the data and a dynamic thermal controller to receive the target setpoint temperature from the thermal control interface and control a thermal actuator based on the target setpoint temperature.
Edits on 5 Jul, 2023
Golden AI
Edits made to:
Infobox (+1 properties)
Infobox
Patent Citations Received
Edits on 24 May, 2023
Golden AI
Edits made to:
Infobox (+1 properties)
Infobox
Edits on 20 May, 2023
Golden AI
Edits made to:
Infobox (+1/-1 properties)
US Patent 09869714 Integrated circuit test temperature control mechanism US Patent 9869714 Integrated circuit test temperature control mechanism
Infobox
Patent Number
0986971400
Patent Number
986971400
Edits on 3 Apr, 2023
Golden AI
Infobox
Is a
Patent Applicant
Current Assignee
Patent Jurisdiction
Patent Number
098697140
Date of Patent
January 16, 2018
0Patent Application Number
151854680
Date Filed
June 17, 2016
0Patent Primary Examiner
Edits on 24 Sep, 2022
Golden AI
Infobox
Is a
Patent Applicant
Current Assignee
Patent Jurisdiction
Patent Number
098697140
Date of Patent
January 16, 2018
0Patent Application Number
151854680
Date Filed
June 17, 2016
0Patent Primary Examiner
Edits on 16 Jan, 2022
Golden AI
Edits made to:
Infobox (+9 properties)
US Patent 09869714 Integrated circuit test temperature control mechanism
Infobox
Is a
Patent applicant
Current assignee
Patent jurisdiction
Patent number
09869714
Date of patent
January 16, 2018
Patent application number
15185468
Date Filed
June 17, 2016
Patent primary examiner
Find more entities like US Patent 9869714 Integrated circuit test temperature control mechanism
Use the Golden Query Tool to find similar entities by any field in the Knowledge Graph, including industry, location, and more.
By using this site, you agree to our Terms of Service.