US Patent 9869585 Dual spectrometer

Systems and techniques for optical spectrometer detection using, for example, IR spectroscopy components and Raman spectroscopy components are described. For instance, a system includes a first electromagnetic radiation source configured to illuminate a sample with a first portion of electromagnetic radiation in a first region of the electromagnetic spectrum (e.g., an IR source) and a second electromagnetic radiation source configured to illuminate a sample with a second portion of electromagnetic radiation in a second substantially monochromatic region of the electromagnetic spectrum (e.g., a laser source). The system also includes a detector module configured to detect a sample constituent of a sample by analyzing a characteristic of electromagnetic radiation reflected from the sample associated with the first electromagnetic radiation source and a characteristic of electromagnetic radiation reflected from the sample associated with the second electromagnetic radiation source.