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US Patent 9779930 Multiplexed electrostatic linear ion trap

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Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
9779930
Date of Patent
October 3, 2017
Patent Application Number
15107177
Date Filed
December 6, 2014
Patent Citations Received
‌
US Patent 11842891 Ion detector
3
‌
US Patent 11837452 Charge detection mass spectrometry
4
Patent Primary Examiner
‌
David E Smith
Patent abstract

Systems and methods are provided for performing multiplex electrostatic linear ion trap mass spectrometry. A first beam of ions is received and the first beam is split into N beams of ions using a beam splitter. N is two or more. Ions are received from only one of the N beams of ions at each entrance aperture of N entrance apertures of an electrostatic linear ion trap (ELIT). Ions from each entrance aperture of the N entrance apertures are trapped in separate linear flight paths using the ELIT, producing N separate linear flight paths. Ion oscillations in the N separate linear flight paths are measured at substantially the same time using the ELIT. The ELIT uses two concentric mirrors with N apertures to trap ions in the N separate linear flight paths. The ELIT uses an image current detector with N apertures to the measure the ion oscillations.

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