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US Patent 9666412 Method for charging and imaging an object

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Patent abstractTimelineTable: Further ResourcesReferences
Is a
Patent
Patent
1

Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
1
Patent Number
96664121
Patent Inventor Names
Alon Litman1
Yoram Uziel1
Benzion Sender1
Date of Patent
May 30, 2017
1
Patent Application Number
150056791
Date Filed
January 25, 2016
1
Patent Citations Received
‌
US Patent 12087542 Image contrast enhancement in sample inspection
2
Patent Primary Examiner
‌
Wyatt Stoffa
1
Patent abstract

A system that may include a first mechanical stage, a second mechanical stage, charged particle beam optics and a controller. The system may charge, with a charged particle beam, a slice of the object. During the charging of the slice the first mechanical stage may introduce a first movement along a first direction, between the object and charged particle beam optics. The charged particle beam optics may scan the slice with the charged particle beam. The scanning of the slice includes performing, by the charged particle optics, a first counter-movement deflection of the charged particle beam to at least partially counter the first movement. The second mechanical stage is configured to introduce a second movement along a second direction, between the object and the charged particle beam optics. Upon a completion of the charging of the slice, the second mechanical stage is configured to perform a first flyback operation.

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