US Patent 9658916 System analysis device, system analysis method and system analysis program

A system analysis device 100 includes a whole model generation unit 1021 which generates a whole model which is obtained by modeling elements or whole of a system and which includes a plurality of partial models, a core model generation unit 1023 which extracts, from a plurality of whole models generated on the basis of the same event, the partial models whose prediction precision satisfies a predetermined criteria, and generates a core model by integrating the extracted partial models, and a threshold setting unit 1024 which calculates a distance between the core model and the plurality of whole models using a predetermined definition, and outputs the distance as a threshold value for error determination using the core model.