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US Patent 9578808 Multi-sensor crop yield determination

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
Date Filed
May 16, 2014
Date of Patent
February 28, 2017
Patent Application Number
14279947
Patent Citations Received
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US Patent 12127500 Machine control using a map with regime zones
0
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US Patent 12069986 Map generation and control system
0
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US Patent 12080062 Predictive map generation based on seeding characteristics and control
0
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US Patent 12082531 Systems and methods for predicting material dynamics
0
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US Patent 11711995 Machine control using a predictive map
0
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US Patent 11778945 Machine control using real-time model
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US Patent 11849672 Machine control using a predictive map
0
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US Patent 11849671 Crop state map generation and control system
0
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US Patent 11864483 Predictive map generation and control system
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US Patent 11874669 Map generation and control system
0
•••
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
9578808
Patent Primary Examiner
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Lisa Caputo

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