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US Patent 9493342 Wafer level MEMS force dies

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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
9493342
Date of Patent
November 15, 2016
Patent Application Number
13924047
Date Filed
June 21, 2013
Patent Citations Received
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US Patent 11874183 Systems and methods for continuous mode force testing
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US Patent 11946817 Integrated digital force sensors and related methods of manufacture
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US Patent 11874185 Force attenuator for force sensor
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US Patent 11965787 Sealed force sensor with etch stop layer
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US Patent 11946816 Wafer bonded piezoresistive and piezoelectric force sensor and related methods of manufacture
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US Patent 11698310 Slotted MEMS force sensor
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US Patent 11754451 Integrated piezoresistive and piezoelectric fusion force sensor
Patent Primary Examiner
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Kenneth Parker
Patent abstract

A composite wafer level MEMS force dies including a spacer coupled to a sensor is described herein. The sensor includes at least one flexible sensing element, such as a beam or diaphragm, which have one or more sensor elements formed thereon. Bonding pads connected to the sensor elements are placed on the outer periphery of the sensor. The spacer, which protects the flexible sensing element and the wire bonding pads, is bonded to the sensor. For the beam version, the bond is implemented at the outer edges of the die. For the diaphragm version, the bond is implemented in the center of the die. An interior gap between the spacer and the sensor allows the flexible sensing element to deflect. The gap can also be used to limit the amount of deflection of the flexible sensing element in order to provide overload protection.

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