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US Patent 9442075 Galvanometer scanned camera with variable focus and method

Patent 9442075 was granted and assigned to Virtek Vision International Inc. on September, 2016 by the United States Patent and Trademark Office.

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Patent
Patent

Patent attributes

Patent Applicant
Virtek Vision International Inc.
Virtek Vision International Inc.
Current Assignee
Virtek Vision International Inc.
Virtek Vision International Inc.
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
9442075
Date of Patent
September 13, 2016
Patent Application Number
14200204
Date Filed
March 7, 2014
Patent Citations Received
‌
US Patent 11656072 Classification of laser speckle profiles for validation of part placement in an assembly task
0
Patent Primary Examiner
‌
Seung C Sohn
Patent abstract

A camera assembly for generating a high resolution image of an area of interest on a workpiece includes a sensor array and an optical lens that focuses light reflected from the workpiece onto the sensor array. The sensor array is inclined relative to an optical axis defined by the optical lens disposed in a fixed position relative to the optical lens. A galvanometer driven mirror assembly directs a field of view of the optical lens toward the area of interest on the workpiece translating light reflected from the area of interest of the workpiece onto the sensor array. The inclination of the sensor array provides varying degrees of resolution relative to a distance of the workpiece area of interest from the camera assembly enabling the camera assembly to generate high resolution images at varying distances from the camera assembly without adjusting the optical lens relative to the sensor array.

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