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US Patent 9410840 Multi-variable yield monitor and methods for the same

Patent 9410840 was granted and assigned to Raven Industries on August, 2016 by the United States Patent and Trademark Office.

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Contents

Is a
Patent
Patent

Patent attributes

Patent Applicant
Raven Industries
Raven Industries
Current Assignee
Raven Industries
Raven Industries
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
9410840
Date of Patent
August 9, 2016
Patent Application Number
13835054
Date Filed
March 15, 2013
Patent Citations Received
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US Patent 12127500 Machine control using a map with regime zones
0
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US Patent 12069986 Map generation and control system
0
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US Patent 12080062 Predictive map generation based on seeding characteristics and control
0
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US Patent 12082531 Systems and methods for predicting material dynamics
0
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US Patent 11653588 Yield map generation and control system
0
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US Patent 11678607 Apparatus, systems and methods for eliminating cross-track error
0
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US Patent 11675354 Machine control using a predictive map
0
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US Patent 11672203 Predictive map generation and control
0
...
Patent Primary Examiner
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Randy W. Gibson
Patent abstract

A dynamic yield monitor system includes a plurality of instruments to measure harvested crop characteristics while a crop is in-flow within a harvester elevator. The system includes a volume instrument that measures a harvested crop volume from the in-flow harvested crop within the harvester elevator, and a weight instrument that measures a harvested crop weight from the in-flow harvested crop within the harvester elevator. Optionally, the system includes other instruments including a moisture and temperature instrument. A receiver and processing node communicates with the instrument. The receiver and processing determines variable harvested crop test weight based on at least the measured harvested crop volume and measured harvested crop weight of the in-flow crop. The receiver and processing node further determines a variable yield of the harvested crop based on the measured harvested crop volume, the measured harvested crop weight, and the variable harvested crop test weight.

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