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US Patent 9404841 Microelectromechanical transducer and test system

Patent 9404841 was granted and assigned to Hysitron, Inc. on August, 2016 by the United States Patent and Trademark Office.

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Patent
Patent
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Patent attributes

Patent Applicant
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Hysitron, Inc.
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Current Assignee
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Hysitron, Inc.
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
94048410
Patent Inventor Names
Oden Warren0
Syed Amanula Syed Asif0
Yunje Oh0
Date of Patent
August 2, 2016
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Patent Application Number
136852540
Date Filed
November 26, 2012
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Patent Citations Received
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US Patent 12027343 Real-time direct measurement of mechanical properties in-situ of scanning beam microscope
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Patent Primary Examiner
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Hezron E. Williams
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Patent abstract

A microelectromechanical transducer and test system is disclosed. One embodiment includes a body, a probe moveable relative to the body, and a micromachined comb drive. The micromachined comb drive includes a plurality of sensing capacitors forming a differential capacitive displacement sensor, each sensing capacitor comprising a plurality of comb capacitors and each configured to provide capacitance levels which, together, are representative of a position of the probe.

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