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US Patent 9336484 System and method for outlier detection via estimating clusters

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Patent
Patent

Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
9336484
Date of Patent
May 10, 2016
Patent Application Number
13615202
Date Filed
September 13, 2012
Patent Citations Received
‌
US Patent 11947570 Data augmentation
0
‌
US Patent 11769078 Systems and methods for transfer learning of neural networks
‌
US Patent 11888874 Label guided unsupervised learning based network-level application signature generation
0
Patent Primary Examiner
‌
John Breene
Patent abstract

An efficient method and system for real-time or offline analysis of multivariate sensor data for use in anomaly detection, fault detection, and system health monitoring is provided. Models automatically derived from training data, typically nominal system data acquired from sensors in normally operating conditions or from detailed simulations, are used to identify unusual, out of family data samples (outliers) that indicate possible system failure or degradation. Outliers are determined through analyzing a degree of deviation of current system behavior from the models formed from the nominal system data. The deviation of current system behavior is presented as an easy to interpret numerical score along with a measure of the relative contribution of each system parameter to any off-nominal deviation. The techniques described herein may also be used to “clean” the training data.

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